DOI：10.13705/j.issn.1671-6841.2023239

Review of Surface Defect Detection Methods Based on Few-shot Learning

CHEN Li ^1，2，3 ， YIN Xiangting ^1，2 ， JIN Qifan ^1，2 ， JIANG Xiaoheng1.²， JIU Mingyua（试读）...